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OS-BA-SAT
A compact stand-alone type beam measuring device with an integrated touch screen.
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Name | Spectral Range | Beam Size Range | Number of Blades | Delivery | Price | Add to cart | |||||||||||||||||||||||
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InGaAs Enhanced (IRE) beam profiler, 3 blades for 1200 - 2700 nm
BA3-IR3E-USB |
1200 - 2700 nm | 3 µm - 3 mm | 3 |
1-3 weeks
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InGaAs (IR) beam profiler, 3 blades for 800 - 1800 nm
BA3-IR5-USB |
800 - 1800 nm | 3 µm - 5 mm | 3 |
1-3 weeks
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InGaAs Enhanced (IRE) beam profiler, 7 blades for 1200 - 2700 nm
BA7-IR3E-USB |
1200 - 2700 nm | 15 µm - 3 mm | 7 |
1-3 weeks
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Silicone (Si) beam profiler, 7 blades for 350 - 1100 nm
BA7-Si-USB |
350 - 1100 nm | 15 µm - 9 mm | 7 |
1-3 weeks
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Silicone (Si) beam profiler, 3 blades for 350 - 1100 nm
BA3-Si-USB |
350 - 1100 nm | 3 µm - 5 mm | 3 |
1-3 weeks
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InGaAs (IR) beam profiler, 7 blades for 800 - 1800 nm
BA7-IR3-USB |
800 - 1800 nm | 15 µm - 3 mm | 7 |
1-3 weeks
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UV-Silicon (UV-Si) beam profiler, 7 blades for 190 - 1100 nm
BA7-UV-USB |
190 - 1100 nm | 15 µm - 9 mm | 7 |
1-3 weeks
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InGaAs (IR) beam profiler, 3 blades for 800 - 1800 nm
BA3-IR3-USB |
800 - 1800 nm | 3 µm - 3 mm | 3 |
1-3 weeks
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UV-Silicon (UV-Si) beam profiler, 3 blades for 190 - 1100 nm
BA3-UV-USB |
190 - 1100 nm | 3 µm - 5 mm | 3 |
1-3 weeks
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InGaAs (IR) beam profiler, 7 blades for 800 - 1800 nm
BA7-IR5-USB |
800 - 1800 nm | 15 µm - 5mm | 7 |
1-3 weeks
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◦Supports a wide wavelength measurement range (190nm to 2700nm), and capable of measuring beam profile, beam size, beam shape, position and beam intensity. It measures beam size between 3μm and 9mm with 0.1μm resolution.
[Features]
◦12-bit A/D converter enables high resolution sampling.
◦Real-time beam profiling displays beam size, beam intensity and Gaussian fits.
◦Capable of calculating the beam gravity center and ellipticity of loaded data. In addition, it can save external control and logging data in Excel or text (.txt) format using RS232C and TCP/IP communication.
◦USB control type is available as option.
[Features]
◦12-bit A/D converter enables high resolution sampling.
◦Real-time beam profiling displays beam size, beam intensity and Gaussian fits.
◦Capable of calculating the beam gravity center and ellipticity of loaded data. In addition, it can save external control and logging data in Excel or text (.txt) format using RS232C and TCP/IP communication.
◦USB control type is available as option.